Multi -beam Ultra-high Voltage Electron Microscope and Materials Research
Seiichi Watanabe Professor
Multi-beam science and engineering applications
At the High-Voltage Electron Microscope (HVEM) Laboratory of Hokkaido University, the world’s first multi -quantum beam HVEM has been developed. It enables in-situ observation of microstructural changes on an atomic scale using multi-quantum beam irradiation.
Content of research
The world’s first multi-quantum beam HVEM (left)
In 2014, we added an optical system that allows the use of multiple lasers, and developed a multi-quantum beam HVEM that allows in-situ observation at the atomic level under irradiation by multi-quantum beams, including ion, laser and electron beams. We are currently developing an in-situ spectroscopy system.
Nanocrystal growth by UV irradiation (right)
We have succeeded in growing ZnO nanocrystals by irradiating submerged plasma-treated Zn with UV light. We are now promoting research on the growth mechanism and its application.
Scientific Report, 5, 11429(2015), AIP Advances, 7(2017) pp. 035220, Other reference: Nano Letters, 17(2017) pp. 2088-2093
Potential for social implementation
- ・Examples of material development research using high-energy quantum beams
- ・Development of materials for harsh environments (high temperature, welding materials)
- ・Development of radiation-resistant materials and space environment materials
- ・Examples of application to green technology
- ・Development of green energy materials
- ・Development of photo-induced non-equilibrium materials
- ・Green nanotechnology applications using light
Appealing points to industry and local governments
The multi-quantum beam HVEM is expected to significantly advance research and development of materials that require high reliability and are intended for use in harsh environments such as space and radiation fields. It is also planned to develop materials that exhibit outstanding electrical and optical properties, magnetism and catalytic activity, and to apply them to life sciences and perform submerged operand observation.